Course - VLSI Test Methodology - FE8121
FE8121
This course has academic overlap with the course in the table above. If you take overlapping courses, you will receive a credit reduction in the course where you have the lowest grade. If the grades are the same, the reduction will be applied to the course completed most recently.
VLSI Test Methodology
Credits
7.5
Level
Doctoral degree level
Course start
Spring 2011
Duration
1 semester
Language of instruction
English
Examination arrangement
Assignment and Oral examination
About
About the course
Course content
Analysis of physical defects, fault modelling, complexity of test problems, algorithms for automatic test pattern generation, new methods for Built-In Self-Test, mertics for test quality, test of embedded systems.
Learning outcome
Understand and exploit modern methods for test of digital systems.
Learning methods and activities
Lectures, colloquiums, reading of scientific papers, project assignment
Compulsory assignments
- Term paper
Required previous knowledge
Basic theory of test of digital circuits, including the stuck-at fault model, test pattern generation and fault fimulation.
Course materials
To be decided.
Credit reductions
| Course code | Reduction | From |
|---|---|---|
| TFE4141 | 3.7 sp |
Subject areas
- Electronics
- Technological subjects
Contact information
Department with academic responsibility
Examination
Examination
Examination arrangement: Assignment and Oral examination
Grade: Letters
Ordinary examination - Autumn 2010
Oppgave
Weighting
1/3
Muntlig eksamen
Weighting
2/3
Ordinary examination - Spring 2011
Oppgave
Weighting
1/3
Muntlig eksamen
Weighting
2/3