Course content

The course is given every other year, next time autumn 2012.
The course covers theory and advanced analysis techniques in transmission electron microscopy (TEM) and electron diffraction.
Main topics are:
i) Diffraction theory, including kinematic theory, dynamical two beam theory, dispersion surface, manybeam solutions, and absorption effects.
ii)Contrast analysis in microscopy with use in high resolution microscopy and defect studies.
iii) The theory behind advanced analysis techniques such as EDS (X-ray micro analysis), EELS (electron energy loss spectroscopy), EFTEM (energy filtered TEM), CBED (convergent beam electron diffraction), and HAADF/STEM (high angle annular dark field/scanning TEM).

Learning outcome

To understand the underlying theory in transmission electron microscopy and electron diffraction.

Learning methods and activities

The course will partly be given as a guided self study, with some lectures. The aim of the course is to give an introduction to the different experimental techniques described under "academic content".

Recommended previous knowledge

TFY4220 Solid state physics and TFY4255 Materials physics, or corresponding knowledge.

Course materials

B. Fultz and J.M. Howe, "Transmission electron microscopy and diffractometry of materials", 3rd edition (2007), Springer. Tn addition, several articles specified at the beginning of the course.

Credit reductions