Course content

i) Crystallography: Elementary introduction. Point and space groups. International Tables for Crystallography. ii) Diffraction: Kinematic theory for electron, neutron and x-ray diffraction. Ordered materials in polycrystalline and monocrystalline form. Determination of crystal structures. Partially ordered materials. Nano- and microstructures. Small angle scattering. Surfaces. iii) Imaging: Electron microscopy, SEM, TEM. X-ray microscopy, tomography, topography. Scanning surface microscopies, STM, AFM. iv) Inhomogeneities: Defects, dislocations; multicomponent materials. Phase diagrams.
The methods will be illustrated by examples like cerams, semiconductors, organic structures, and "modulated" materials, quasicrystals, surface reconstructions, adsorbates, amorphous materials, low-dimensional structures. Precipitates. Phase transitions.

Learning outcome

Give insight in central methods for revealing the internal structure and dynamics of materials: Diffraction and imaging.

Learning methods and activities

Lectures, calculation exercises, and laboratory exercises. The final grade is based on laboratory exercises (25%) and a final written exam (75%). The course will be given in English if students on an international master program in physics are attending the course. A re-sit examination may be changed from written to oral.

Recommended previous knowledge

TFY4220 Solid State Physics or equivalent.

Course materials

Emil J. Samuelsen: "Materials Physics; structure, diffraction and imaging" NTNU 2004.

Credit reductions