Course content

The course is given every second year, next time will be spring 2012.
Chemical micro analysis is a central topic. Other topics are optimizing operation parameters, new SEM technologies, SEM related specimen preparation techniques, fractography, electron micro diffraction, electron scattering theory, imaging of lattice defects in TEM, and electron energy loss spectroscopy.

Learning outcome

The course gives a theoretical background for chosen applications of SEM, EPMA and TEM.

Learning methods and activities

Lectures. Laboratory works includig practical use of the microscopes.

Compulsory assignments

• Exercises

Recommended previous knowledge

The course is developed for students in materials technology who are using the electron microscopes much in their doctor projects. The course is based on TMT4300 Light and electron microscopy or corresponding experience in scanning and transmission electron microscopy.

Course materials

Literature:
Goldstein, Newbury, Echlin, Joy, Fiori and Lishin: Scanning Electron Micryscopy and X-ray
Microanalyses. (Utvalgte deler.) Jeol: Practical Techniques for Microprobe Analyses.
Williams and Carter: Transmission Electron Microscopy, I-IV.
Lecture notes in EPMA and TEM (in Norwegian).

Credit reductions