course-details-portlet

TFE4575

Physical Methods for Nanostructuring and Characterization, Specialization Course

New from the academic year 2010/2011

Credits 7.5
Level Second degree level
Course start Autumn 2010
Duration 1 semester
Language of instruction English and norwegian
Examination arrangement Work

About

About the course

Course content

The course contains module courses at NTNU NanoLab within a selection of the following topics/techniques: Health environment and security at NTNU NanoLab, Optical microscopy, SEM basic course, AFM, E-beam lithography, Thin film deposition, Nanoimprint basic course, Dry etch, FIB basic course, Functionalization of surfaces, Postprocessing - scribing/sawing and bonding.

Learning outcome

After completion of this course, the students should be able to on their own use a selection of state-of-the-art experimental techniques for nanostructuring and characterization with emphasis on physical methods. The selected methods should be relevant for the Specialization project and Master thesis within Nanotechnology/Nanoelectronics.

Learning methods and activities

Teaching will be in the form of module courses given by NTNU NanoLab, and seminars. The module courses will consist of three parts: theoretical presentation of the function and principles for the instrumentation, practical demonstration, as well as a practical/theoretical test. The students will be offered a theoretical presentation of a larger selection of the topics/techniques given under Academic content. For a limited selection of the experimental techniques of relevance for the Specialization project and Master thesis, a more advanced training and a practical/theoretical test will also be given. Approved practical/theoretical test is required in order to be allowed to use the instrumentation for the Specialisation project and Master thesis.

Course materials

To be announced at the start of the semester.

Subject areas

  • Technological subjects

Contact information

Course coordinator

  • Bjørn-Ove Fimland

Lecturers

Department with academic responsibility

Department of Electronic Systems

Examination

Examination

Examination arrangement: Work
Grade: Passed/Failed

Ordinary examination - Autumn 2010

Arbeider
Weighting 100/100