Course content

i) Crystallography: Elementary introduction. Point and space groups. International Tables for Crystallography. ii) Diffraction: Kinematic theory for electron, neutron and x-ray diffraction. Ordered materials in polycrystalline and monocrystalline form. Determination of crystal structures. Partially ordered materials. Nano- and microstructures. Small angle scattering. Surfaces. iii) Imaging: Electron microscopy, SEM, TEM. X-ray microscopy, tomography, topography. Scanning surface microscopies, STM, AFM. iv) Inhomogeneities: Defects, dislocations; multicomponent materials. Phase diagrams.
The methods will be illustrated by examples like cerams, semiconductors, organic structures, and "modulated" materials, quasicrystals, surface reconstructions, adsorbates, amorphous materials, low-dimensional structures. Precipitates. Phase transitions.

Learning outcome

Students should be able to:
- see the role of advanced characterization techniques in nano- and materials science.
- interpret two-component phase diagrams of solid solutions and eutectics.
- account for connections between microstructure defects and macroscopic properties.
- understand the role of group theory in crystallography, including point groups, space groups and the use of the International Tables for Crystallography.
- use Fourier techniques and the convolution theorem for (partially) crystalline materials.
- account for the production and properties of electron, X-ray and neutron radiation for use in materials research.
- carry out kinematical diffraction calculations of spatial and temporal correlations from materials of varying degree of order.
- perform hands on experiments, including analysis and report writing, of scattering experiments on materials in the solid (bulk and surface), liquid and gaseous phase.
- exploit the differences related to the wide- and small angle regimes of scattering (WAXS, SAXS / SANS).
- explain the connection between diffraction and imaging, with special emphasis on transmission electron microscopy (TEM).
- account for the basic principles of atomic force microscopy (AFM) and scanning tunnelling microscopy (STM).
- judge the feasibility of using the covered experimental techniques to address structure-related problems in a wide range of organic and inorganic material classes.

Learning methods and activities

Lectures, calculation exercises, and laboratory exercises. The final grade is based on laboratory exercises (25%) and a final written exam (75%). The course will be given in English if students on an international master program in physics are attending the course. A re-sit examination may be changed from written to oral.

Recommended previous knowledge

TFY4220 Solid State Physics or equivalent.

Course materials

Emil J. Samuelsen: "Materials Physics; structure, diffraction and imaging" NTNU 2004.

Credit reductions