Transmission electron microscopes (TEM)

Transmission electron microscopes (TEM)

Photo: Ole M. Melgård

The Jeol TEMs are included in a Jeol Competence Centre. The three Jeol TEMs installed in 2013 are part of the NORTEM project. Together they cover a broad range of techniques and access levels.

 

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Jeol JEM ARM200F - Double corrected ColdFEG microscope



Jeol JEM ARM200F - Double corrected ColdFEG microscope


This is one of the most advanced TEMs currently in Europe. The stable coldFEG with both probe and image spherical aberration...

Jeol JEM 2100F - FEG microscope



Jeol JEM 2100F - FEG microscope


This FEG TEM is optimized for all-round advanced materials studies with a special focus on precession diffraction, orientation mapping and...

Jeol JEM 2100 - LaB6 microscope



Jeol JEM 2100 - LaB6 microscope


The 2100 LaB6 is the workhorse for routine TEM studies, configured for easy access and a broad user group. This is the instrument new users are...

Philips CM30 microscope



Philips CM30 microscope


The Philips CM30 microscope was installed in 1990. The microscope is still running and used for both industrial and scientific purposes at a weekly...

Jeol JEM 2010 microscope



Jeol JEM 2010 microscope


With LaB6 filament equipped with STEM, EDS, 2k preGIF CCD and Gatan GIF imaging filter.

The JEM-2010 is a general easy accessible instrument for...

Contact

Contact

Ragnhild Sæterli. Photo: Ole Morten Melgård

Ragnhild Sæterli

Senior Engineer

Email: ragnhild.saterli@ntnu.no

 

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photo_JeolJEM ARM200F

Jeol JEM ARM200F