Hunnestad, Kasper Aas;
Das, Hena;
Hatzoglou, Constantinos;
Holtz, Megan, E.;
Brooks, Charles M.;
Van Helvoort, Antonius;
Schlom, Darrel G.;
Mundy, Julia;
Meier, Dennis.
(2022)Quantifying charged defects in multiferroic superlattices using atom probe tomography.QUOROM-6
; 2022-03-31 - 2022-03-31.
Hunnestad, Kasper Aas;
Hatzoglou, Constantinos;
Khalid, Muhammad Zeeshan;
Vullum, Per Erik;
Zewu, Yan;
Bourret, Edith;
Van Helvoort, Antonius;
Selbach, Sverre Magnus;
Meier, Dennis.
(2022)Atomic-Level Imaging and Quantification of Dopants in a Semiconducting Complex Oxide.MRS spring meeting
. Material research society; 2022-05-10.
Hunnestad, Kasper Aas;
Hatzoglou, Constantinoss;
Khalid, Muhammad Zeeshan;
Vullum, Per Erik;
Yan, Zewu;
Bourret, Edith;
Van Helvoort, Antonius;
Meier, Dennis.
(2021)Detection of Individual Dopants in a Semiconducting Functional Oxide.Atom probe tomography & microcsopy
; 2021-09-28.
Hunnestad, Kasper Aas;
Hatzoglou, Constantinoss;
Khalid, Muhammad Zeeshan;
Vullum, Per Erik;
Zewu, Yan;
Bourret, Edith;
Selbach, Sverre Magnus;
Van Helvoort, Antonius;
Meier, Dennis.
(2021)3D analysis of dopants in a multiferroic oxide by atom probe tomography.Norwegian Nanosymposium
; 2021-10-05.
Hunnestad, Kasper Aas;
Hatzoglou, Constantinoss;
Van Helvoort, Antonius;
Meier, Dennis.
(2021)Atomic-scale analysis of individual dopants in a functional oxide.German Physical Association
; 2021-09-28.
