Course content

Analysis of physical defects, fault modelling, complexity of test problems, algorithms for automatic test pattern generation, new methods for Built-In Self-Test, mertics for test quality, test of embedded systems.

Learning outcome

A. Knowledge:
1) Understand and exploit modern methods for test of digital systems.

B. Skills:
1) Develop a testability structure for a module, use this for test execution, and measure fault coverage.
2) Use available tools for test generation and fault simulation.
3) By completing a testability design project, have gained experience in test development and application

Learning methods and activities

Lectures, colloquiums, reading of scientific papers, project assignment

Compulsory assignments

• Term paper

Required previous knowledge

Basic theory of test of digital circuits, including the stuck-at fault model, test pattern generation and fault fimulation.

Course materials

To be decided.

Credit reductions