TFY4195 - Optics

About

Examination arrangement

Examination arrangement: Written examination
Grade: Letters

Evaluation form Weighting Duration Examination aids Grade deviation
Written examination 100/100 4 hours C

Course content

Geometrical optics. Matrix treatment of imaging systems. Abberations. Wave optics and polarization. Optical waveguiding and fibre optics. Coherence, correlation, and interference. Fourier optics and diffraction. Introduction to optical imaging systems: human eye, camera, telescope, microscope. Introduction to optical spectroscopy, light sources and light detectors.

Learning outcome

The student should have a command of geometrical optics, the ray equation as derived from Fermat's principle (the variational principle) and from the wave description, design of optical systems in the gaussian paraxial approximation with detailed knowledge of gaussian and newtonian imaging relations, cardinal points, and the paraxial matrix formalism for refractive and reflective optical systems. The student should obtain a solid understanding of image formation (both within geometrical optics and within the gaussian approximation) and basic knowledge about deviations from the gaussian approximation caused by aberration. The student should understand the relation between pupils and wave optics concerning resolution criteria for optical systems. The student should understand the connection between image quality and apertures.
The wave optics part of the course should provide the student with solid knowledge of interferometry, coherence, polarization, and diffraction, including basic fourier optics and the wave description of image formation. The student should be able to analyze and understand interference of plane waves and spherical waves; be able to analyze reflection and transmission of plane waves through plane surfaces; optical waveguiding in thin films and optical fibers. The student should acquire a solid knowledge of the polarization of light and its modification upon reflection and transmission through interfaces, plates, and thin films, and be able to analyze optical systems with the help of the Jones formalism. The student should be able to derive equations of interference for plane waves from thin films and Fabry-Perot type structures, and understand the changes in polarization upon reflection and trsnsmission through plane interfaces. The student should be able to derive the Fresnel and the Fraunhofer diffraction integrals, and know their regions of validity. The student should be able to apply the convolution theorem within fourier optics, in order to analyze diffraction from complex systems.
Finally, the student will acquire knowledge about typical optical imaging systems (such as eye, camera, telescope, and microscope), and in addition basic principles and technology for spectrometry including light sources and detectors.

Learning methods and activities

Lectures and problem solving. Compulsory lab-work. The course will be given in English if students on the international master program in physics are attending the course. The re-sit examination (in August) may be changed from written to oral.

Compulsory assignments

  • Laboratory exercises

Specific conditions

Exam registration requires that class registration is approved in the same semester. Compulsory activities from previous semester may be approved by the department.

Course materials

Book: E. Hecht "Optics" - 4th ed. (Addison Wesley; N.-Y. 2002).

Credit reductions

Course code Reduction From To
SIF4040 7.5

Examination

Examination arrangement: Written examination

Term Statuskode Evaluation form Weighting Examination aids Date Time Room *
Spring ORD Written examination 100/100 C 2016-05-23 09:00 Galleri A , K3 , Møterom 8 , R D1-102 Datasal
Summer KONT Written examination 100/100 C 2016-08-08 09:00 Storhall del 2
  • * The location (room) for a written examination is published 3 days before examination date.
If more than one room is listed, you will find your room at Studentweb.