course-details-portlet

TFY4195

Optics

Credits 7.5
Level Second degree level
Course start Spring 2016
Duration 1 semester
Language of instruction English
Examination arrangement Written examination

About

About the course

Course content

Geometrical optics. Matrix treatment of imaging systems. Abberations. Wave optics and polarization. Optical waveguiding and fibre optics. Coherence, correlation, and interference. Fourier optics and diffraction. Introduction to optical imaging systems: human eye, camera, telescope, microscope. Introduction to optical spectroscopy, light sources and light detectors.

Learning outcome

The student should have a command of geometrical optics, the ray equation as derived from Fermat's principle (the variational principle) and from the wave description, design of optical systems in the gaussian paraxial approximation with detailed knowledge of gaussian and newtonian imaging relations, cardinal points, and the paraxial matrix formalism for refractive and reflective optical systems. The student should obtain a solid understanding of image formation (both within geometrical optics and within the gaussian approximation) and basic knowledge about deviations from the gaussian approximation caused by aberration. The student should understand the relation between pupils and wave optics concerning resolution criteria for optical systems. The student should understand the connection between image quality and apertures.
The wave optics part of the course should provide the student with solid knowledge of interferometry, coherence, polarization, and diffraction, including basic fourier optics and the wave description of image formation. The student should be able to analyze and understand interference of plane waves and spherical waves; be able to analyze reflection and transmission of plane waves through plane surfaces; optical waveguiding in thin films and optical fibers. The student should acquire a solid knowledge of the polarization of light and its modification upon reflection and transmission through interfaces, plates, and thin films, and be able to analyze optical systems with the help of the Jones formalism. The student should be able to derive equations of interference for plane waves from thin films and Fabry-Perot type structures, and understand the changes in polarization upon reflection and trsnsmission through plane interfaces. The student should be able to derive the Fresnel and the Fraunhofer diffraction integrals, and know their regions of validity. The student should be able to apply the convolution theorem within fourier optics, in order to analyze diffraction from complex systems.
Finally, the student will acquire knowledge about typical optical imaging systems (such as eye, camera, telescope, and microscope), and in addition basic principles and technology for spectrometry including light sources and detectors.

Learning methods and activities

Lectures and problem solving. Compulsory lab-work. The course will be given in English if students on the international master program in physics are attending the course. The re-sit examination (in August) may be changed from written to oral.

Compulsory assignments

  • Laboratory exercises

Course materials

Book: E. Hecht "Optics" - 4th ed. (Addison Wesley; N.-Y. 2002).

Credit reductions

Course code Reduction From
SIF4040 7.5 sp
This course has academic overlap with the course in the table above. If you take overlapping courses, you will receive a credit reduction in the course where you have the lowest grade. If the grades are the same, the reduction will be applied to the course completed most recently.

Subject areas

  • Physics
  • Optics
  • Technological subjects

Contact information

Course coordinator

  • Dag Werner Breiby

Lecturers

  • Dag Werner Breiby

Department with academic responsibility

Department of Physics

Examination

Examination

Examination arrangement: Written examination
Grade: Letters

Re-sit examination - Summer 2016

Written examination
Weighting 100/100 Date 2016-08-08 Time 09:00 Duration 4 timer Place and room Not specified yet.

Ordinary examination - Spring 2016

Written examination
Weighting 100/100 Date 2016-05-23 Time 09:00 Duration 4 timer Place and room Not specified yet.