Jochen Thilo Busam
About
In the production of mc Si solar cells, the contamination by O, C and N from the SiO2 crucible and coating during solidification is insufficiently understood: the reported diffusion coefficients in Si and SiO2 disagree and the system is heterogeneous as it consist of different phases over a wide temperature range.
I try to determine the process parameters by local impurity measurements down to ppb level in ingot and crucible, model the system based on the findings and assess possibilities to reduce impurity levels through variations in the system.
To do that I produce several ingots with coating and crucible of varying purity. The chemical analysis is performed with GDMS, FTIR and other techniques. The electrical properties of Si are determined by lifetime and dislocation density measurements. Modelling is based on COMSOL Multiphysics.
By that, I aim to develop cost efficient improvements to the solidification process that lead to profitable mc Si solar cells with increased efficiency.
Publications
2024
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Gawel, Bartlomiej;
Busam, Jochen Thilo;
Marthinsen, Astrid;
Warden, Gabriela Kazimiera;
Hallam, Benny;
Sabatino, Marisa Di.
(2024)
Influence of aluminium doping on high purity quartz glass properties.
RSC Advances
Academic article
2023
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Søndenå, Rune;
Stokkan, Gaute;
Busam, Jochen Thilo;
Hendawi, Rania ;
Hallam, Benny;
Sabatino, Marisa Di.
(2023)
Electrical properties and microstructure of crystalline silicon ingots grown from quartz crucibles with and without diffusion barriers.
AIP Publishing (American Institute of Physics)
Academic chapter/article/Conference paper
2022
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Busam, Jochen;
Paudel, Gagan;
Di Sabatino Lundberg, Marisa.
(2022)
Silicon and indium as secondary cathodes for the analysis of solid alumina and sapphire by slow-flow direct-current glow discharge mass spectrometry.
Journal of Analytical Atomic Spectrometry
Academic article
2021
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Busam, Jochen;
Stokkan, Gaute;
Muggerud, Astrid Marie F;
Di Sabatino Lundberg, Marisa.
(2021)
Application of 7N In as secondary cathode for the direct current-glow discharge mass spectrometry analysis of solid, fused high-purity quartz.
Journal of Mass Spectrometry
Academic article
2018
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Busam, Jochen;
Wenner, Sigurd;
Muggerud, Astrid Marie;
Van Helvoort, Antonius.
(2018)
Structural Characterization of Natural Quartz by Scanning TEM.
Microscopy and Microanalysis
Academic article
Journal publications
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Gawel, Bartlomiej;
Busam, Jochen Thilo;
Marthinsen, Astrid;
Warden, Gabriela Kazimiera;
Hallam, Benny;
Sabatino, Marisa Di.
(2024)
Influence of aluminium doping on high purity quartz glass properties.
RSC Advances
Academic article
-
Busam, Jochen;
Paudel, Gagan;
Di Sabatino Lundberg, Marisa.
(2022)
Silicon and indium as secondary cathodes for the analysis of solid alumina and sapphire by slow-flow direct-current glow discharge mass spectrometry.
Journal of Analytical Atomic Spectrometry
Academic article
-
Busam, Jochen;
Stokkan, Gaute;
Muggerud, Astrid Marie F;
Di Sabatino Lundberg, Marisa.
(2021)
Application of 7N In as secondary cathode for the direct current-glow discharge mass spectrometry analysis of solid, fused high-purity quartz.
Journal of Mass Spectrometry
Academic article
-
Busam, Jochen;
Wenner, Sigurd;
Muggerud, Astrid Marie;
Van Helvoort, Antonius.
(2018)
Structural Characterization of Natural Quartz by Scanning TEM.
Microscopy and Microanalysis
Academic article
Part of book/report
-
Søndenå, Rune;
Stokkan, Gaute;
Busam, Jochen Thilo;
Hendawi, Rania ;
Hallam, Benny;
Sabatino, Marisa Di.
(2023)
Electrical properties and microstructure of crystalline silicon ingots grown from quartz crucibles with and without diffusion barriers.
AIP Publishing (American Institute of Physics)
Academic chapter/article/Conference paper
Outreach
2018
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PosterBusam, Jochen; Wenner, Sigurd; Muggerud, Astrid Marie; Van Helvoort, Antonius. (2018) Characterization of beam sensitive quartz by STEM. NGU, IMA & SINTEF Nature Conference Minerals and Materials for a Sustainable Future , Trondheim 2018-09-13 - 2018-09-15
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PosterBusam, Jochen; Wenner, Sigurd; Muggerud, Astrid Marie; Van Helvoort, Antonius. (2018) Scanning transmission electron microscopy of beam sensitive quartz. IoP EMAG2018 , Warwick 2018-07-04 - 2018-07-06
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PosterBusam, Jochen; Wenner, Sigurd; Muggerud, Astrid Marie; Van Helvoort, Antonius. (2018) Characterisation of Beam Sensitive Quartz by Scanning TEM. CEN-DTU/Scandem Scandem 2018 , Copenhagen 2018-06-25 - 2018-06-28
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PosterBusam, Jochen; Wenner, Sigurd; Muggerud, Astrid Marie; Van Helvoort, Antonius. (2018) Structural Characterization of Natural Quartz by STEM. MSA Microscopy&Microanalysis 2018 , Baltimore 2018-08-05 - 2018-08-09