Course - Optical, Electrical and Magnetic Characterization Techniques - FE8140
FE8140 - Optical, Electrical and Magnetic Characterization Techniques
About
Examination arrangement
Examination arrangement: Oral examination
Grade: Passed / Not Passed
| Evaluation | Weighting | Duration | Grade deviation | Examination aids |
|---|---|---|---|---|
| Oral examination | 100/100 | 1 hours |
Course content
The course is taught normally every other year.
The objective is to provide students with a broad and deep understanding of the principles of optical, electrical and magnetic characterization techniques used in research and development of emerging electronic and photonic materials and devices.
Starting from the concept of probe-target interaction, the course gives insights into some of the most widespread used characterization techniques in nanoelectronics, photonics and solid-state physics. A theoretical framework is provided, in which basic phenomena involving electromagnetic radiation and charged particles are described and presented as means to access to a plethora of physical quantities. As photon-matter interactions are concerned, effects such as elastic scattering, diffraction, absorption, phase/polarization perturbation, photo-emission and photoelectric effect are addressed and discussed in relation to relevant techniques. As for charges-matter interactions, cathodoluminescence, electron scattering, absorption and diffraction, ion-induced photoemission are introduced and discussed in relation to relevant techniques. In the course, the main limitations and advantages of the presented characterization techniques will be discussed, particularly referring to specific application domains such as sensing and optoelectronics.
Learning outcome
Knowledge. The candidate has: (1) good knowledge about the fundamental mechanisms underlying the most important physical characterization techniques used in the framework of micro/nano structured materials and solid-state physics; (2) good knowledge about the relevant use and limitations of characterization techniques based on specific probe-target interactions; (3) good knowledge of the fundamental architectural elements used in practical setups and experimental configurations.
Skills. The candidate can: (1) identify what kind of physical interaction is best suited in order to access the desired physical quantity/characteristics in exemplary situations of practical interest; (2) evaluate the limit and the application range of each characterization technique presented; (3) identify practical strategies aimed at improving the performance of the presented experimental techniques.
General Competence. The candidate can: (1) apply basic research methodologies in photonic and electronic material and device development; (2) evaluate, integrate, and apply relevant information from numerous sources to create cohesive, persuasive arguments, and to propose solutions; (3) identify ethical issues related to implementations.
Recommended previous knowledge
Master of Science in electronics/photonics or equivalent
Required previous knowledge
Master of Science in electronics/photonics or equivalent
Course materials
To be announced at start of course
No
Version: 1
Credits:
7.5 SP
Study level: Doctoral degree level
Term no.: 1
Teaching semester: AUTUMN 2023
Language of instruction: English
Location: Trondheim
- Electronics and Telecommunications
- Astrid Aksnes
- Bjørn Ove Myking Fimland
- Dag Roar Hjelme
- Erik Folven
- Lise Lyngsnes Randeberg
- Per Thomas Martin Tybell
- Torstein Bolstad
Department with academic responsibility
Department of Electronic Systems
Examination
Examination arrangement: Oral examination
- Term Status code Evaluation Weighting Examination aids Date Time Examination system Room *
- Autumn ORD Oral examination 100/100
-
Room Building Number of candidates - Spring ORD Oral examination 100/100
-
Room Building Number of candidates
- * The location (room) for a written examination is published 3 days before examination date. If more than one room is listed, you will find your room at Studentweb.
For more information regarding registration for examination and examination procedures, see "Innsida - Exams"