# FY8905 - Materials Physics

### Examination arrangement

Examination arrangement: Aggregate score

Evaluation Weighting Duration Grade deviation Examination aids
Report 30/100
School exam 70/100 4 hours C

### Course content

i) Structure: Structure representation in solid state physics with main focus on crystallography: Elementary introduction. Point and space groups. International Tables for Crystallography. Elementary introduction group theory related to crystallography.

ii) Diffraction: Kinematic theory for electron, neutron and x-ray diffraction. Deviations from ideal kinematic diffraction, for example because of size or shape. Analysis of ordered materials in polycrystalline and monocrystalline form. Determination of crystal structures. Partially ordered materials. Structure determination, materials without long-range order Nano- and microstructures.

iii) Spectroscopy: Emission and absorption spectroscopy techniques based on matter - X-ray and electron beam interactions for electron band structure analysis.

iv) Imaging: Electron microscopy (SEM, TEM) and X-ray microscopy. 3D imaging

### Learning outcome

Knowledge

The candidate should gain knowledge of:

• Symmetry in crystallography as used in point groups and space groups
• Fourier techniques and the convolution theorem for describing and analysis of (partially) crystalline materials.
• Diffraction-based structural analysis of materials using electron, X-ray and neutron radiation and the complementary of these different probes.
• Principles of spectroscopy techniques in X-ray and electron beam set-ups.
• Principles behind imaging in electron microscopy (SEM/TEM) and X-ray imaging.

Skills

The candidate should be able to:

• Use of the International Tables for Crystallography and link basic group theory to crystallography.
• Do kinematical diffraction calculations of spatial and temporal correlations from materials of varying degree of order.
• Explain deviations between kinematical calculated and observed intensities.
• Analyze variations in diffraction intensity for deducing structural material characteristics in real space.
• Make the connection between diffraction and imaging.

General competence

The candidate should be able to:

• See the role of advanced characterization techniques (Diffraction, spectroscopy and imaging) in solid state physics, nanotechnology and materials science.
• Perform hands on experiments, including data analysis and report writing, of scattering experiments on materials.
• Judge the feasibility of using the covered experimental techniques to address structure-related problems in a wide range of organic and inorganic material classes.

### Learning methods and activities

Lectures, calculation exercises, and laboratory exercises. The course will be given in English if students on an international master program or non-norwegian PhDs are attending the course. Lecture material and exam are in English.

### Further on evaluation

Partial assessment. "Delvurdering"; written exam and report. The student must pass both the exam and the report. The re-sit examination (in August) may be changed from written to oral. The exam is in English.

### Specific conditions

Admission to a programme of study is required:
Biophysics (PHBIFY)
Physics (PHFY)

### Course materials

Will be specified at the beginning of the course.

### Credit reductions

Course code Reduction From To
TFY4255 7.5 AUTUMN 2010
More on the course

No

Facts

Version: 1
Credits:  7.5 SP
Study level: Doctoral degree level

Coursework

Term no.: 1
Teaching semester:  AUTUMN 2024

Language of instruction: English

Location: Trondheim

Subject area(s)
• Physics
• Technological subjects
Contact information
Course coordinator: Lecturer(s):

Department of Physics

# Examination

#### Examination arrangement: Aggregate score

Term Status code Evaluation Weighting Examination aids Date Time Examination system
Autumn ORD School exam 70/100
Autumn ORD Report 30/100
Spring UTS School exam 70/100
• * The location (room) for a written examination is published 3 days before examination date. If more than one room is listed, you will find your room at Studentweb.
Examination

For more information regarding registration for examination and examination procedures, see "Innsida - Exams"

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