FY8905 - Materials Physics
i) Crystallography: Elementary introduction. Point and space groups. International Tables for Crystallography. ii) Diffraction: Kinematic theory for electron, neutron and x-ray diffraction. Ordered materials in polycrystalline and monocrystalline form. Determination of crystal structures. Partially ordered materials. Nano- and microstructures. Small angle scattering. Surfaces. iii) Imaging: Electron microscopy, SEM, TEM. X-ray microscopy, tomography, topography. Scanning surface microscopies, STM, AFM. iv) Inhomogeneities: Defects, dislocations; multicomponent materials. Phase diagrams.
The methods will be illustrated by examples like cerams, semiconductors, organic structures, and "modulated" materials, quasicrystals, surface reconstructions, adsorbates, amorphous materials, low-dimensional structures. Precipitates. Phase transitions.
Students should be able to: - see the role of advanced characterization techniques in nano- and materials science. - interpret two-component phase diagrams of solid solutions and eutectics. - account for connections between microstructure defects and macroscopic properties. - understand the role of group theory in crystallography, including point groups, space groups and the use of the International Tables for Crystallography. - use Fourier techniques and the convolution theorem for (partially) crystalline materials. - account for the production and properties of electron, X-ray and neutron radiation for use in materials research. - carry out kinematical diffraction calculations of spatial and temporal correlations from materials of varying degree of order. - perform hands on experiments, including analysis and report writing, of scattering experiments on materials in the solid (bulk and surface), liquid and gaseous phase. - exploit the differences related to the wide- and small angle regimes of scattering. - explain the connection between diffraction and imaging, with special emphasis on transmission electron microscopy (TEM). - account for the basic principles of atomic force microscopy (AFM) and scanning tunnelling microscopy (STM). - judge the feasibility of using the covered experimental techniques to address structure-related problems in a wide range of organic and inorganic material classes.
Learning methods and activities
Lectures, calculation exercises, and laboratory exercises. The final result is based on laboratory exercises (25%) and a final written exam (75%). The course will be given in English if students on an international master program in physics are attending the course. When lectures and lecture material are in English, the exam may be given in English only. A re-sit exam in August may be changed from written to oral.
Further on evaluation
The final grade is based on portfolio assessment. The portfolio includes written exam and report. The evaluation of the different parts is given in %-points, while the entire portfolio is given passed or not passed. For a re-take of an examination, all assessments in the portfolio must be re-taken.
Recommended previous knowledge
TFY4220 Solid State Physics or equivalent.
The course material will be announced before the first lecture
Examination arrangement: Portfolio assessment
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- * The location (room) for a written examination is published 3 days before examination date.