MT8219 - Applied Electron Microscopy


Examination arrangement

Examination arrangement: Oral examination
Grade: Passed/Failed

Evaluation form Weighting Duration Examination aids Grade deviation
Oral examination 100/100 D

Course content

The course is offered every alternate year, next time Autumn 2020.

The course is divided in three main parts which amount to about 1/3 each:
- Transmission electron microscopy (TEM)
- Scanning electron microscopy (SEM)
- Specimen preparation methods and techniques for TEM and SEM and damage analysis

Learning outcome

The course is intended to give a theoretical basis for the practical application of SEM and TEM in selected areas of material science and enginnering

After completed the course the student should be able to
- account for the theory behind X-ray microanalysis in SEM/TEM
- carry out qualitative and quantitative microanalysis in SEM/TEM
- account for the basic theory of electron scattering from a crystalline material
- account for the different contrast mechanisms which can be used in TEM
- account for the basic theory for imaging of crystal defects in TEM
- account for the theory and perform lattice imaging in TEM
- account for the basic principles of a spectrometer and basic theory for electron energy loss spectroscopy (EELS)
- carry out imaging and perform specimen thickness measurements by EELS
- carry out qualitative and quantitative microstructure characterization using the EBSD technique in SEM
- account for the theory for high resolution (field emmisson) SEM
- carry out high resolution imaging in FESEM
- evaluate the most appropriate specimen preparation technique and carry out adequate specimen preparation for electron microscopy (SEM/TEM)
- account for the most common damage mechanisms in metals
- evaluate the most appropriate procedure to characterize the damage mechanisms operating during fracture

Learning methods and activities

Lectures. Laboratory works includig practical use of the microscopes.
Expected time use: lectures 40 hours, laboratory work 40 hours, self study 120 hours.

Compulsory assignments

  • Laboratory exercises

Specific conditions

Exam registration requires that class registration is approved in the same semester. Compulsory activities from previous semester may be approved by the department.

Course materials

Course material:
Goldstein, Newbury, Echlin, Joy, Fiori and Lishin: Scanning Electron Microscopy and X-ray Microanalyses. (Utvalgte deler.)
Utvalgte papers
Brooks & Choudhury: Metallurgical Failure Analysis
Williams, David B., Carter, C. Barry: Transmission Electron Microscopy - A Textbook for Materials Science Springer 2. Ed 2009. (e-bok)

More on the course

Version: 1
Credits:  7.5 SP
Study level: Doctoral degree level


Term no.: 1
Teaching semester:  AUTUMN 2020

No.of lecture hours: 2
Lab hours: 2
No.of specialization hours: 8

Language of instruction: English, Norwegian

Location: Trondheim

Subject area(s)
  • Materials Science and Engineering
  • Solid State Physics
Contact information
Course coordinator: Lecturer(s):

Department with academic responsibility
Department of Materials Science and Engineering



Examination arrangement: Oral examination

Term Status code Evaluation form Weighting Examination aids Date Time Digital exam Room *
Autumn ORD Oral examination 100/100 D
Room Building Number of candidates
Spring ORD Oral examination 100/100 D
Room Building Number of candidates
  • * The location (room) for a written examination is published 3 days before examination date. If more than one room is listed, you will find your room at Studentweb.

For more information regarding registration for examination and examination procedures, see "Innsida - Exams"

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