MT8219 - Applied Electron Microscopy


Lessons are not given in the academic year 2023/2024

Course content

The course is offered every alternate year, next time autumn 2024. The course is divided in three main parts which amount to about 1/3 each: - Transmission electron microscopy (TEM) - Scanning electron microscopy (SEM) - Specimen preparation methods and techniques for TEM and SEM and damage analysis

Learning outcome

The course is intended to give a theoretical basis for the practical application of SEM and TEM in selected areas of material science and enginneringAfter completed the course the student should be able to - account for the theory behind X-ray microanalysis in SEM/TEM- carry out qualitative and quantitative microanalysis in SEM/TEM- account for the basic theory of electron scattering from a crystalline material- account for the different contrast mechanisms which can be used in TEM- account for the basic theory for imaging of crystal defects in TEM- account for the theory and perform lattice imaging in TEM - account for the basic principles of a spectrometer and basic theory for electron energy loss spectroscopy (EELS) - carry out imaging and perform specimen thickness measurements by EELS- carry out qualitative and quantitative microstructure characterization using the EBSD technique in SEM- account for the theory for high resolution (field emmisson) SEM- carry out high resolution imaging in FESEM- evaluate the most appropriate specimen preparation technique and carry out adequate specimen preparation for electron microscopy (SEM/TEM)- account for the most common damage mechanisms in metals- evaluate the most appropriate procedure to characterize the damage mechanisms operating during fracture

Learning methods and activities

Lectures. Laboratory works includig practical use of the microscopes.Expected time use: lectures 40 hours, laboratory work 40 hours, self study 120 hours.

Compulsory assignments

  • Laboratory exercises

Course materials

Course material: Goldstein, Newbury, Echlin, Joy, Fiori and Lishin: Scanning Electron Microscopy and X-ray Microanalyses. (Utvalgte deler.) Utvalgte papersBrooks & Choudhury: Metallurgical Failure Analysis Williams, David B., Carter, C. Barry: Transmission Electron Microscopy - A Textbook for Materials Science Springer 2. Ed 2009. (e-bok)

More on the course

Version: 1
Credits:  7.5 SP
Study level: Doctoral degree level



Language of instruction: English, Norwegian

Location: Trondheim

Subject area(s)
  • Materials Science and Engineering
  • Solid State Physics
Contact information

Department with academic responsibility
Department of Materials Science and Engineering


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