Course content

The course is offered every alternate year, next time autumn 2024. The course is divided in three main parts which amount to about 1/3 each: - Transmission electron microscopy (TEM) - Scanning electron microscopy (SEM) - Specimen preparation methods and techniques for TEM and SEM and damage analysis

Learning outcome

The course is intended to give a theoretical basis for the practical application of SEM and TEM in selected areas of material science and enginneringAfter completed the course the student should be able to - account for the theory behind X-ray microanalysis in SEM/TEM- carry out qualitative and quantitative microanalysis in SEM/TEM- account for the basic theory of electron scattering from a crystalline material- account for the different contrast mechanisms which can be used in TEM- account for the basic theory for imaging of crystal defects in TEM- account for the theory and perform lattice imaging in TEM - account for the basic principles of a spectrometer and basic theory for electron energy loss spectroscopy (EELS) - carry out imaging and perform specimen thickness measurements by EELS- carry out qualitative and quantitative microstructure characterization using the EBSD technique in SEM- account for the theory for high resolution (field emmisson) SEM- carry out high resolution imaging in FESEM- evaluate the most appropriate specimen preparation technique and carry out adequate specimen preparation for electron microscopy (SEM/TEM)- account for the most common damage mechanisms in metals- evaluate the most appropriate procedure to characterize the damage mechanisms operating during fracture

Learning methods and activities

Lectures. Laboratory works includig practical use of the microscopes.Expected time use: lectures 40 hours, laboratory work 40 hours, self study 120 hours.

Compulsory assignments

• Laboratory exercises

Recommended previous knowledge

The course is developed for students in materials technology who are using the electron microscopes much in their doctor projects. The course is based on TMT4300 Light and electron microscopy or corresponding experience in scanning and transmission electron microscopy.

Course materials

Course material: Goldstein, Newbury, Echlin, Joy, Fiori and Lishin: Scanning Electron Microscopy and X-ray Microanalyses. (Utvalgte deler.) Utvalgte papersBrooks & Choudhury: Metallurgical Failure Analysis Williams, David B., Carter, C. Barry: Transmission Electron Microscopy - A Textbook for Materials Science Springer 2. Ed 2009. (e-bok)