Course content

• Structure: Structure representation in solid state physics. Elementary introduction to crystallography: symmetry and group theory.
• Radiation sources for X-rays, neutrons and electrons. Large scale facilities: synchrotrons and X-ray free electron lasers (XFEL), Reactors and spallation sources.
• Interactions between radiation and matter: electromagnetic radiation, neutrons, electrons. Rayleigh scattering, Raman scattering, photoelectric effect, Compton scattering. Resonant scattering. Polarization. Index of refraction, refraction and reflection for X-rays and neutrons. Brilliance and coherence.
• Scattering from amorphous and weakly ordered materials. Small-angle scattering.
• Diffraction: Kinematic theory for electron, neutron and x-ray diffraction. The Born approximation. Fourier transforms and diffraction. Discrete Fourier transform. Dynamic theory. Analysis of ordered materials in polycrystalline and monocrystalline form. Crystal structure determination. Texture.
• Spectroscopy: Basic introduction to emission and absorption spectroscopy techniques, including UV-vis and Raman.
• Imaging: Connection between imaging and diffraction. Wave optics. Fourier optics. Imaging with and without lenses. Electron microscopy (SEM, TEM). Neutron, and X-ray microscopy. 3D imaging, computed tomography (CT). Introduction to holography and computational imaging.

Learning outcome

Knowledge - the candidate should gain knowledge of:

• The prominent role of advanced scattering-based characterization techniques across the natural sciences.
• Scattering-based structural analysis of materials using electron, X-ray and neutron radiation and the complementarity of these different probes.
• The role of symmetry and group theory in crystallography.
• Basic principles of spectroscopy.
• Fourier techniques for describing and analyzing kinematic diffraction.
• The production and properties of electron, X-ray and neutron radiation for materials research.
• The use, potential and limitations of microscopy and imaging in scientific and industrial applications.
• Modern developments within imaging, tomography and holography.

Skills: the candidate should be able to:

• Perform scattering based experiments in the laboratory
• Analyze and report results of scattering and imaging experiments on materials in the solid, liquid and gaseous phases.
• Carry out kinematical diffraction calculations.
• Explain and exploit the differences related to the wide- and small angle regimes of scattering (WAXS, SAXS / SANS).
• Judiciously choose experimental techniques for specific challenges.
• Explain and exploit the connection between diffraction and imaging.
• Estimate requirements in key parameters like resolution, contrast and incident flux needed to perform a given experiment.
• Judge the feasibility of using the covered experimental techniques to address structure-related problems in a wide range of organic and inorganic material classes.

Learning methods and activities

Lectures, calculation exercises, and laboratory exercises. The course will be given in English if students on an international master program in physics are attending the course. Lecture material is in English. Expected workload in the course is 225 hours.

Joint lectures with FY8905.

Recommended previous knowledge

TFY4220 Solid State Physics or equivalent.

TFY4195 Optics or equivalent.

Course materials

"Elements of Modern X-ray Physics", 2nd Ed. Jens Als-Nielsen, Des McMorrow. Wiley 2011.

Additional literature will be specified at the beginning of the course.

Credit reductions