TFY4255 - Materials Physics

About

Examination arrangement

Examination arrangement: Portfolio assessment
Grade: Letters

Evaluation form Weighting Duration Examination aids Grade deviation
Work 25/100 ALLE
Written examination 75/100 C

Course content

i) Crystallography: Elementary introduction. Point and space groups. International Tables for Crystallography. ii) Diffraction: Kinematic theory for electron, neutron and x-ray diffraction. Ordered materials in polycrystalline and monocrystalline form. Determination of crystal structures. Partially ordered materials. Nano- and microstructures. Small angle scattering. Surfaces. iii) Imaging and spectroscopy: Electron microscopy, SEM, TEM. X-ray microscopy. iv) Inhomogeneities: Defects, dislocations; multicomponent materials. Phase diagrams.
The methods will be illustrated by examples like cerams, semiconductors, organic structures, and "modulated" materials, surface reconstructions, adsorbates, amorphous materials, low-dimensional structures. Precipitates. Phase transitions.

Learning outcome

Students should be able to:
- See the role of advanced characterization techniques in nano- and materials science.
- Interpret two-component phase diagrams of solid solutions and eutectics.
- Understand crystallography, including point groups, space groups and the use of the International Tables for Crystallography and link group theory to crystallography.
- Use Fourier techniques and the convolution theorem for (partially) crystalline materials.
- Account for the production and properties of electron, X-ray and neutron radiation for use in materials research.
- Carry out kinematical diffraction calculations of spatial and temporal correlations from materials of varying degree of order.
- Perform hands on experiments, including data analysis and report writing, of scattering experiments on materials in the solid (bulk and surface) phase.
- Exploit the differences related to the wide- and small angle regimes of scattering.
- Explain the connection between diffraction and imaging, with special emphasis on transmission electron microscopy (TEM).
- Account for the basic principles of spectroscopy techniques in X-ray and electron beam set-ups.
- Judge the feasibility of using the covered experimental techniques to address structure-related problems in a wide range of organic and inorganic material classes.

Learning methods and activities

Lectures, calculation exercises, and laboratory exercises.
The course will be given in English if students on an international master program in physics are attending the course. When lectures and lecture material are in English, the exam may be given in English only.

Further on evaluation

The final grade is based on portfolio assessment. The portfolio includes written exam (75%) and works/laboratory exercises (25%). The evaluation of the different parts is given in %-points, while the entire portfolio is given a letter grade. For a re-take of an examination, all assessments in the portfolio must be re-taken.

The re-sit examination (in August) may be changed from written to oral.

Course materials

Will be specified at the beginning of the course.

Credit reductions

Course code Reduction From To
FY8905 7.5 2010-09-01
SIF4067 7.5

Timetable

Detailed timetable

Examination

Examination arrangement: Portfolio assessment

Term Statuskode Evaluation form Weighting Examination aids Date Time Room *
Autumn ORD Work 25/100 ALLE
Autumn ORD Written examination 75/100 C 2017-12-16 09:00
  • * The location (room) for a written examination is published 3 days before examination date.
If more than one room is listed, you will find your room at Studentweb.