The area is equipped for the following activities:

• High resolution S(T)EM for imaging and material analysis (EDS)
• Focused ion beam (Dual beam FIB) for micro structuring, TEM-sample preparation and 3D reconstruction of materials, including material analysis (EDAX) and micromanipulators
• SEM (low vacuum) for fast and simple imaging and material analysis (EDS)
• Surface characterization with profilometer
• AFM in air, inert gas or liquid, at different temperatures. Mechanical probing.
• Sample preparation for electron microscopy (metal/carbon coating, UV/ozone cleaning)

Equipment:

• Scanning electron microscope combined with a focused ion beam (Dual beam FIB)
• Scanning electron microscope for high resolution imaging, including S(T)EM option
• Table top scanning electron microscope for fast, low resolution imaging
• Research AFM and student AFM
• Optical microscopes
• Profilometer
• Student STM
• Sputter coaters, plasma cleaner and UV/ozone cleaner